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Data Products
Real-time monitoring. Higher yield Cymer has introduced a suite of data collection, reporting and analysis products that enable tighter process control and improved wafer quality. For OnPulse™ customers. Cymer's OnPulse Plus data product provides real-time light source parameter monitoring and lot-level event correlation. Key parameters include energy, wavelength and bandwidth. Cymer's SmartPulse data product is the first data management tool to provide wafer-level light source parameter monitoring to enable direct correlation to on-wafer performance for improved process control and yield. SmartPulse also introduces a unique beam metrology module that delivers real-time beam performance data from the light source, resulting in a comprehensive data set that includes beam pointing, divergence, energy density and polarization.
OnPulse Plus™ is available for all dual-chamber ArF (XLA and XLR) light sources as well as single-chamber KrF (ELS 6000 and 7000 series) light sources. SmartPulse™ is available for all dual-chamber ArF (immersion and dry) light sources. A data collection module is installed by Cymer on the light source and a Cymer data server collects, analyzes and reports the information for all connected light sources. SmartPulse also includes new on-board beam metrology that is installed on the ArF light sources. Easy to use Secure data Extendible Learn more about Cymer data products |
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